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5962-01-441-0081

Memory Microcircuit

5962014410081 014410081 AM27C020250DC

A circuit designed to store information and/or coded instructions. Item has pins or other connections to install in a computer or computing device. Does not include magnetic drums, tapes, punched cards or the like. For items that have portable type connections see MEMORY, PORTABLE, SOLID STATE. View more Memory Microcircuit

5962-01-441-0081 MICROCIRCUIT,MEMORY 5962014410081 014410081

Managed by United States
NSN Created on 30 Jan 1997
Data Last Changed
November 2023
NATO Update Count
4
NATO Data Quality
5962-01-441-0081 MICROCIRCUIT,MEMORY 5962014410081 014410081 1/1
NSN 5962-01-441-0081 (Generic Image) 1/1

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5962-01-441-0081 Demil Restrictions 5962-01-441-0081

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: N | PMIC: A | EDC: A | ADPEC: 0

5962-01-441-0081 is a Memory Microcircuit that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item is not suspected to be hazardous. This item does not contain a precious metal.

5962-01-441-0081 End Users End Users 5962-01-441-0081

France (ZF01)
Effective Date:
1 Jan 1997

5962-01-441-0081 Manufacturers Approved Sources 5962-01-441-0081

5962-01-441-0081 Technical Data Datasheet 5962-01-441-0081

Characteristic
Specifications
Memory Device Type [CZER]
Eprom
Operating Temp Range [AFGA]
+0.0/+70.0 Deg Celsius
Inclosure Configuration [CQSZ]
Dual-In-Line
Voltage Rating And Type Per Characteristic [CZEN]
5.0 Volts Nominal Power Source
Terminal Type And Quantity [TTQY]
32 Pin

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5962-01-441-0081 Freight Data Freight Information 5962-01-441-0081

5962-01-441-0081 has freight characteristics.. 5962-01-441-0081 has a variance between NMFC and UFC when transported by rail and the description should be consulted.