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5961-01-662-1493

Diode Semiconductor Device

5961016621493 016621493 BAT54-7-F

A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes LIGHT EMITTING DIODE and SEMICONDUCTOR DEVICE,PHOTO. For items containing material such as selenium and copper oxide, see RECIFIER, METALLIC. View more Diode Semiconductor Device

5961-01-662-1493 SEMICONDUCTOR DEVICE,DIODE 5961016621493 016621493

Managed by United States
NSN Created on 28 Mar 2017
Data Last Changed
January 2023
NATO Update Count
1
NATO Data Quality
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NSN 5961-01-662-1493 (Generic Image) 1/1

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5961-01-662-1493 Demil Restrictions 5961-01-662-1493

DEMIL: A | DEMILI: 1 | CRITICALITY: X | HMIC: N | PMIC: A | EDC: A | ADPEC: 0

5961-01-662-1493 is a Diode Semiconductor Device that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item is not suspected to be hazardous. This item does not contain a precious metal.

5961-01-662-1493 HTS and ScheduleB Import and Export 5961-01-662-1493

5961-01-662-1493 End Users End Users 5961-01-662-1493

Republic of Korea (ZH01)
Effective Date:
1 Mar 2017

5961-01-662-1493 Manufacturers Approved Sources 5961-01-662-1493

5961-01-662-1493 Technical Data Datasheet 5961-01-662-1493

Characteristic
Specifications
FIIG
A110A0
Part Name Assigned By Controlling Agency [CXCY]
Dio Schottky Bat54 Vr

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5961-01-662-1493 Freight Data Freight Information 5961-01-662-1493

5961-01-662-1493 has freight characteristics managed by the Republic of Korea.. 5961-01-662-1493 has a variance between NMFC and UFC when transported by rail and the description should be consulted.