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5961-01-612-4979
Diode Semiconductor Device
5961016124979 016124979 TX900
A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes LIGHT EMITTING DIODE and SEMICONDUCTOR DEVICE,PHOTO. For items containing material such as selenium and copper oxide, see RECIFIER, METALLIC. View more Diode Semiconductor Device
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January 2023
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Related Documents 5961-01-612-4979 2+ Documents (More...)
-01-612-4979 Diode Semiconductor Device 5961016124979 /fsg-59/fsc-5961/us 5961 -01-612-4979 Diode Semiconductor
Device 5961016124979 /fsg-59/fsc-5961/us 5961 -01-612-4979 Diode Semiconductor Device 5961016124979
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Restrictions 5961-01-612-4979
5961-01-612-4979 is a Diode Semiconductor Device that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item is not suspected to be hazardous. This item does not contain a precious metal.
Import and Export 5961-01-612-4979
- Schedule B
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- HTS Code
- Subscribe to View HTS Code
End Users 5961-01-612-4979
- Canada (ZC01)
- Effective Date:
- 1 Oct 2012
Approved Sources 5961-01-612-4979
- Part Number
- Manufacturer
- Status
- TX900
- Manufacturer
- 4U744 - Fluke Electronics Corp (Active)
- Primary Buy
- Primary Buy
Datasheet 5961-01-612-4979
- Characteristic
- Specifications
- FIIG
- Specifications
- A110A0
- Part Name Assigned By Controlling Agency [CXCY]
- Microwave Leakage Detector
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Freight Information 5961-01-612-4979
5961-01-612-4979 has freight characteristics managed by the Department of the Air Force.. 5961-01-612-4979 has a variance between NMFC and UFC when transported by rail and the description should be consulted.