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5961-01-341-1416

Photo Semiconductor Device

5961013411416 013411416 FPT120B

A Semiconductor Device (1) which is responsive to visible or infrared radiant energy. May or may not include mounting hardware and/or heat sink. Excludes SEMICONDUCTOR DEVICE (1), DIODE; SEMICONDUCTOR DEVICE (1), THYRISTOR AND TRANSISTOR. For solid state devices which emit visible or infrared radiant energy, see LIGHT EMITTING DIODE. View more Photo Semiconductor Device

5961-01-341-1416 SEMICONDUCTOR DEVICE,PHOTO 5961013411416 013411416

Managed by United States
NSN Created on 25 Jun 1991
Data Last Changed
January 2023
NATO Update Count
6
NATO Data Quality
5961-01-341-1416 SEMICONDUCTOR DEVICE,PHOTO 5961013411416 013411416 1/1
NSN 5961-01-341-1416 (Generic Image) 1/1

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5961-01-341-1416 Demil Restrictions 5961-01-341-1416

DEMIL: Q | DEMILI: | CRITICALITY: X | HMIC: N | PMIC: U | EDC: A | ADPEC:

5961-01-341-1416 is a Photo Semiconductor Device that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is a confirmed Commerce Control List Item (CCLI). This item is not suspected to be hazardous. The precious metals content of this item is unknown.

5961-01-341-1416 HTS and ScheduleB Import and Export 5961-01-341-1416

5961-01-341-1416 End Users End Users 5961-01-341-1416

Canada (ZC01)
Effective Date:
1 Apr 1991

5961-01-341-1416 Manufacturers Approved Sources 5961-01-341-1416

5961-01-341-1416 Technical Data Datasheet 5961-01-341-1416

Characteristic
Specifications
FIIG
A110A0
Voltage Rating In Volts Per Characteristic [CTQN]
15.0 Maximum Breakdown Voltage, Collector-To-Emitter, Base Open
Maximum Operating Temp Per Measurement Point [CTSG]
85.0 Deg Celsius Ambient Air
Special Features [FEAT]
Junction Pattern Arrangement: Npn

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5961-01-341-1416 Freight Data Freight Information 5961-01-341-1416

5961-01-341-1416 has freight characteristics managed by Canada.. 5961-01-341-1416 has a variance between NMFC and UFC when transported by rail and the description should be consulted.