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5961-01-281-6183

Transistor

5961012816183 012816183 2N6603

An active semiconductor device with three or more electrodes. May or may not include mounting hardware and/or heatsink. Excludes SEMICONDUCTOR DEVICE, DIODE and SEMICONDUCTOR DEVICE, THYRISTOR. For solid state devices which are responsive to visible or infrared radiant energy, see SEMICONDUCTOR DEVICE, PHOTO. View more Transistor

5961-01-281-6183 TRANSISTOR 5961012816183 012816183

Managed by United States
NSN Created on 28 Jun 1988
Data Last Changed
January 2023
NATO Update Count
10
NATO Data Quality
5961-01-281-6183 TRANSISTOR 5961012816183 012816183 1/1
NSN 5961-01-281-6183 (Generic Image) 1/1

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5961-01-281-6183 Demil Restrictions 5961-01-281-6183

DEMIL: Q | DEMILI: | CRITICALITY: X | HMIC: N | PMIC: U | EDC: A | ADPEC:

5961-01-281-6183 is a Transistor that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is a confirmed Commerce Control List Item (CCLI). This item is not suspected to be hazardous. The precious metals content of this item is unknown.

5961-01-281-6183 HTS and ScheduleB Import and Export 5961-01-281-6183

5961-01-281-6183 End Users End Users 5961-01-281-6183

Canada (ZC01)
Effective Date:
1 Apr 1991
Netherlands (ZN01)
Effective Date:
1 Feb 1996
Portugal (ZP01)
Effective Date:
1 Feb 1995

5961-01-281-6183 Manufacturers Approved Sources 5961-01-281-6183

5961-01-281-6183 Technical Data Datasheet 5961-01-281-6183

Characteristic
Specifications
FIIG
A110A0
Semiconductor Material [CTMZ]
Silicon
Voltage Rating In Volts Per Characteristic [CTQN]
15.0 Maximum Breakdown Voltage, Collector To Emitter, Sustained
Inclosure Material [ABBH]
Metal
Joint Electronic Device Engineering Council/Jedec/Case Outline Designation [ALAZ]
T0-3

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5961-01-281-6183 Freight Data Freight Information 5961-01-281-6183

5961-01-281-6183 has freight characteristics managed by Canada.. 5961-01-281-6183 has a variance between NMFC and UFC when transported by rail and the description should be consulted.