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5961-01-072-1172

Diode Semiconductor Device

5961010721172 010721172 801341-2

A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes LIGHT EMITTING DIODE and SEMICONDUCTOR DEVICE,PHOTO. For items containing material such as selenium and copper oxide, see RECIFIER, METALLIC. View more Diode Semiconductor Device

5961-01-072-1172 SEMICONDUCTOR DEVICE,DIODE 5961010721172 010721172

Managed by United States
NSN Created on 23 Feb 1979
Data Last Changed
January 2023
NATO Update Count
12
NATO Data Quality
5961-01-072-1172 SEMICONDUCTOR DEVICE,DIODE 5961010721172 010721172 1/1
NSN 5961-01-072-1172 (Generic Image) 1/1

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5961-01-072-1172 Demil Restrictions 5961-01-072-1172

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: N | PMIC: U | EDC: A | ADPEC:

5961-01-072-1172 is a Diode Semiconductor Device that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item is not suspected to be hazardous. The precious metals content of this item is unknown.

5961-01-072-1172 HTS and ScheduleB Import and Export 5961-01-072-1172

5961-01-072-1172 End Users End Users 5961-01-072-1172

New Zealand (ZE01)
Effective Date:
1 Apr 1991
Germany (ZG01)
Effective Date:
1 Apr 1991
Italy (ZR01)
Effective Date:
1 Apr 1991

5961-01-072-1172 Manufacturers Approved Sources 5961-01-072-1172

5961-01-072-1172 Technical Data Datasheet 5961-01-072-1172

Characteristic
Specifications
FIIG
A110A0
Current Rating Per Characteristic [CTQX]
50.00 Amperes Forward Current, Average Absolute
Features Provided [CBBL]
Hermetically Sealed Case
Maximum Operating Temp Per Measurement Point [CTSG]
175.0 Deg Celsius Ambient Air
Mounting Facility Quantity [AKPV]
1
Mounting Method [AXGY]
Terminal And Threaded Stud
Nominal Thread Size [CQJX]
0.250 Inches
Semiconductor Material [CTMZ]
Silicon
Overall Diameter [ADAV]
0.667 Inches Maximum
Overall Length [ABHP]
0.274 Inches Maximum
Voltage Rating In Volts Per Characteristic [CTQN]
100.0 Maximum Reverse Voltage, Peak
Terminal Length [ABJT]
0.550 Inches Nominal
Terminal Type And Quantity [TTQY]
1 Tab, Solder Lug And 1 Threaded Stud
Thread Series Designator [THSD]
Unf

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5961-01-072-1172 Freight Data Freight Information 5961-01-072-1172

5961-01-072-1172 has freight characteristics.It has a National Motor Freight Classification (NMFC) of 063025. A Sub NMFC of Z. It has a NMFC Description of SEMICONDUCTORS/DEVICES NOI ETC. 5961-01-072-1172 is rated as a variable freight class when transported by Less-Than Truckload (LTL) freight. It has a Uniform Freight Classification (UFC) number of 34525 which rates the freight between FCL and LCL. 5961-01-072-1172 has a variance between NMFC and UFC when transported by rail and the description should be consulted. It has a Water Commodity Code (WCC) of 658 for ocean manifesting and military sealift. 5961-01-072-1172 is not classified as a special type of cargo when transported by water. 5961-01-072-1172 is not a consolidation and does not exceed 84" in any dimension. It should be compatible with a standard 72" Aircraft Cargo Door when transported by air.

5961-01-072-1172 Packaging Data Packaging Data 5961-01-072-1172

Responsible Activity
Packaging Data Source
Primary Inventory Control Activity (PICA)
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Item Pack Level (Unpackaged)

Item Size
Item Weight
Characteristics
Weight/Dimensions Category
Fragility
Item Preservation
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0.25 lb or less, one dimension 2" or less, other dimensions less than 24"
85 to 110G
No Requirement

Unit Pack Level (Packaged)

Quantity per Pack
Unit Size
Unit Weight
Unit Cube
Preservation Method
Cleaning/Drying
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Preservation Material
Wrapping Material
Cushioning/Dunnage
Cushioning Thickness
Container
Special Marking
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Intermediate Pack Level

Quantity of Unit Packs
Container
See Method of Preservation
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