5961-12-154-5558

Diode Semiconductor Device

5961121545558 121545558 0A126/9 0A126-9

A two electrode semiconductor device having an asymmetrical voltage - current characteristic. May or may not include mounting hardware and/or heatsink. Excludes LIGHT EMITTING DIODE and SEMICONDUCTOR DEVICE,PHOTO. For items containing material such as selenium and copper oxide, see RECIFIER, METALLIC. View more Diode Semiconductor Device

5961-12-154-5558 SEMICONDUCTOR DEVICE,DIODE 5961121545558 121545558

Managed by Germany
NSN Created on 30 May 1969
Data Last Changed
January 2023
NATO Update Count
1
NATO Data Quality
5961-12-154-5558 SEMICONDUCTOR DEVICE,DIODE 5961121545558 121545558 1/1
NSN 5961-12-154-5558 (Generic Image) 1/1

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Diode Semiconductor Device 5961121545558 5961-12-154-5558 5961121545558 121545558 is a two electrode
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Diode Semiconductor Device 5961121545558 5961-12-154-5558 5961121545558 121545558 is a two electrode
4730-00-316-5424 4730003165424 003165424 is a replaceable device designed to remove solid particles from flowing liquids. the removal of particles is accomplished by porous material (metallic or non-metallic), wire mesh, perforated metal, or the like, constructed so the liquid can flow through the device while the solid particles are retained. it is designed to fit into a strainer, sediment (or similar cavity). it may have a reinforcement to prevent collapsing, distorting or rupturing. the degree of particles removed must be nominally rated at 50 microns, or more, or absolutely rated at 75 microns, or more. see also filter element, fluid.
4730-00-316-5423 4730003165423 003165423 is a replaceable device designed to remove solid particles from flowing liquids. the removal of particles is accomplished by porous material (metallic or non-metallic), wire mesh, perforated metal, or the like, constructed so the liquid can flow through the device while the solid particles are retained. it is designed to fit into a strainer, sediment (or similar cavity). it may have a reinforcement to prevent collapsing, distorting or rupturing. the degree of particles removed must be nominally rated at 50 microns, or more, or absolutely rated at 75 microns, or more. see also filter element, fluid.

5961-12-154-5558 Demil Restrictions 5961-12-154-5558

DEMIL: | DEMILI: | CRITICALITY: | HMIC: | PMIC: | EDC: | ADPEC:

5961-12-154-5558 is a Diode Semiconductor Device

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