4920-00-170-4075

Electronic Systems Test Set

4920001704075 001704075 7951933-001

A test set specifically designed for use in making examinations and providing discrete evaluations of the over-all performance of a system(s) or subsystem(s). Excludes TEST SET (1), ANTENNA SYSTEM; TEST SET (1), FIRE CONTROL SYSTEM; TEST SET (1), FLIGHT CONTROL SYSTEM; and TEST SET (1), TELEMETERING SYSTEM. View more Electronic Systems Test Set

4920-00-170-4075 TEST SET,ELECTRONIC SYSTEMS 4920001704075 001704075

Managed by United States
NSN Created on 14 Feb 1973
Data Last Changed
November 2023
NATO Update Count
6
NATO Data Quality
4920-00-170-4075 TEST SET,ELECTRONIC SYSTEMS 4920001704075 001704075 1/1
NSN 4920-00-170-4075 (Generic Image) 1/1

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4920-00-170-4075 Related Documents Related Documents 4920-00-170-4075 1+ Documents (More...)

Dec 1975 5962-01-014-2789 Linear Microcircuit 7000677RNCC: 1 | RNVC: 2 | DAC: 1 18 Dec 1975 4920-00-170-4075

4920-00-170-4075 Demil Restrictions 4920-00-170-4075

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: N | PMIC: U | EDC: | ADPEC: 0

4920-00-170-4075 is a Electronic Systems Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item is not suspected to be hazardous. The precious metals content of this item is unknown.

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